Description
RL OF SUCH VALUE AS TO CAUSE. NEGLIGIBLE DC DROP AT IDSS. BYPASS . Figure 13. Typical yfs Test Circuit. 6000. 5000. 3000. 2000. 1000. 700. 500. 300. 0.1. 0.2. 0.5. 1.0. 2.0. 5.0. 10. 2N4222, A. 2N4221, A. 2N4220, A. y fs. , F .
Part Number | 2SK117Y |
Brand | Toshiba |
Image |
2SK117Y
TOSHBIA
6018
0.32
Dedicate Electronics (HK) Limited
2SK117-Y
TOSHI
66
1.595
AIC Semiconductor Co., Limited
2SK117-Y(TPE2-F)
TOSIBA
7000
2.87
Bonase Electronics (HK) Co., Limited
2SK117-Y
TOSIHBA
10000
4.145
Cicotex Electronics (HK) Limited
2SK1170
TOSHIDA
3200
5.42
Belt (HK) Electronics Co